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Test vector
Results: 217

#	Item
161	Objective Inspection of Marking Quality, Fraunhofer IFF Magdeburg Project Information Add to Reading List Source URL: www.iff.fraunhofer.de Language: English - Date: 2014-12-05 17:46:03 Car safety ANOVA gauge R&R Camera lens Vector space Requirement MOT test Algebra Mathematics Measurement
162	Computer Science Technical Report Using Machine Learning Techniques to Detect Metamorphic Relations for Programs without Test Oracles Add to Reading List Source URL: www.cs.colostate.edu Language: English - Date: 2013-06-17 13:47:22 Machine learning Support vector machine Metamorphic testing Mutation testing Binary classification Cross-validation Oracle Statistics Software testing Statistical classification
163	AN 39: IEEE[removed]JTAG Boundary-Scan Testing in Altera Devices Add to Reading List Source URL: www.altera.com Language: English - Date: 2010-05-05 19:29:24 Electronic engineering Joint Test Action Group Boundary scan Altera Field-programmable gate array Shift register Boundary scan description language Serial Vector Format Electronics manufacturing Manufacturing Electronics
164	TUGboat, Volume[removed]), No[removed]Some Test Data 1 Add to Reading List Source URL: tug.org. Language: English - Date: 1998-03-13 09:57:58 Digital typography Donald Knuth PostScript Vector graphics markup languages MetaPost Public domain software Metafont TeX Computer font Computing Application software Software
165	August 25, 1998 USE OF SX SERIES DEVICES AND IEEE[removed]JTAG CIRCUITRY Add to Reading List Source URL: klabs.org Language: English - Date: 2009-01-17 09:42:46 Electronic engineering Embedded systems IEEE standards Joint Test Action Group Boundary scan Serial Vector Format Electronics manufacturing Manufacturing Electronics
166	MICHIGAN TEST FOR TEACHER CERTIFICATION (MTTC) TEST OBJECTIVES FIELD 022: MATHEMATICS (SECONDARY) Subarea Mathematical Processes and Number Concepts Add to Reading List Source URL: www.mttc.nesinc.com Language: English - Date: 2011-09-14 11:50:35 Logarithm Areas of mathematics Complex number Matrix Combinatorics Vector space Mathematical optimization Analysis Trigonometric functions Mathematics Algebra Discrete mathematics
167	What is happening with IEEE P1581? Heiko Ehrenberg ([removed]) GOEPEL Electronics LLC, Austin, Texas, USA Memory devices have been becoming more complex with every generation and this trend will continue. Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-12-12 13:59:44 Electronic engineering IEEE standards Boundary scan Joint Test Action Group IEEE Standards Association Field-programmable gate array Electronic design automation Serial Vector Format Boundary scan description language Electronics manufacturing Manufacturing Electronics
168	mLab: A Mobile Ad Hoc Network Test Bed A. Karygiannis and E. Antonakakis National Institute of Standards and Technology {karygiannis, manos}@nist.gov Abstract Add to Reading List Source URL: csrc.nist.gov Language: English - Date: 2007-09-19 01:00:00 Wireless ad-hoc network Mobile ad hoc network Wireless sensor network Ad hoc On-Demand Distance Vector Routing Wireless LAN Wireless mesh network Ad-hoc QoS multicast Wireless networking Technology Telecommunications engineering
169	Package ‘seqminer’ July 2, 2014 Type Package Title Efficiently Read Sequence Data (VCF format, BCF format and METAL format) into R Version 3.1 Date[removed] Add to Reading List Source URL: cran.r-project.org Language: English - Date: 2014-07-02 16:27:43 System software Test Bzip2 Tar Euclidean vector VCard Zip Archive formats Computing Data compression
170	Vector article: English Language Proficiency Add to Reading List Source URL: www.caa.govt.nz Language: English - Date: 2010-07-22 20:06:16 Language acquisition Language education Language proficiency Test Education Pedagogy Education in the United States

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